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A machine vision system for defect characterization on transparent parts with non-plane surfaces

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Abstract

This contribution presents a machine vision system capable of revealing, detecting and characterizing defects on non-plane transparent surfaces. Because in this kind of surface, transparent and opaque defects can be found, special lighting conditions are required. Therefore, the cornerstone of this machine vision is the innovative lighting system developed. Thanks to this, the defect segmentation is straightforward and with a very low computational burden, allowing real-time inspection. To aid in the conception of the imaging conditions, the lighting system is completely described and also compared with other commercial lighting systems. In addition, for the defect segmentation, a new adaptive threshold selection algorithm is proposed. Finally, the system performance is assessed by conducting a series of tests using a commercial model of headlamp lens.

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Authors and Affiliations

  1. Electronic Engineering and Automation Department, University of Jaén, Jaén, Spain

    S. Satorres Martínez, J. Gómez Ortega, J. Gámez García & A. Sánchez García

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  1. S. Satorres Martínez
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  2. J. Gómez Ortega
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  3. J. Gámez García
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  4. A. Sánchez García
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Correspondence to S. Satorres Martínez.

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Satorres Martínez, S., Gómez Ortega, J., Gámez García, J. et al. A machine vision system for defect characterization on transparent parts with non-plane surfaces. Machine Vision and Applications 23, 1–13 (2012). https://doi.org/10.1007/s00138-010-0281-0

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  • DOI: https://doi.org/10.1007/s00138-010-0281-0

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