Abstract
It is necessary to monitor the grain size characteristics of particles at production site to control the production equipment, for the assurance of product quality. In this respect, prior research finds that it is critical to evaluate the accuracy of tiny particles since the current practice indicates that the existing methods illustrate multiple shortcomings including large measure error, low accuracy and poor repeatability. Therefore, to improve the accuracy of particles, monitoring this study proposed a calibration method based on SVR algorithm to predict the accurate pixel size of the particles. Results revealed that high-precision pixel mapping of the sensitive area transforms the pixel mapping of the particle image closer to the actual size and improves the measurement precision of the whole system.
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Jing, H., Yadav, A., Khan, A., Yadav, D. (2021). A High-Precision Pixel Mapping Method for Image-Sensitive Areas Based on SVR. In: Panigrahi, C.R., Pati, B., Mohapatra, P., Buyya, R., Li, KC. (eds) Progress in Advanced Computing and Intelligent Engineering. Advances in Intelligent Systems and Computing, vol 1198. Springer, Singapore. https://doi.org/10.1007/978-981-15-6584-7_4
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DOI: https://doi.org/10.1007/978-981-15-6584-7_4
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