Nothing Special   »   [go: up one dir, main page]

Skip to main content

Part of the book series: Lecture Notes in Computer Science ((LNTCS,volume 6951))

  • 1287 Accesses

Abstract

The most efficient power saving method in digital systems is to scale Vdd, owing to the quadratic dependence of dynamic power consumption. This requires memory working under a wide range of Vdds in terms of performance and power saving requirements. A self-timed 6T SRAM was previously proposed, which adapts to the variable Vdd automatically. However due to leakage, the size of memory is restricted by process variations. This paper reports a new self-timed 10T SRAM cell with bit line keepers developed to improve robustness in order to work in a wide range of Vdds down to 0.3V under PVT variations. In addition, this paper briefly discusses the potential benefits of the self-timed SRAM for designing highly reliable systems and detecting the data retention voltage (DRV).

This is a preview of subscription content, log in via an institution to check access.

Access this chapter

Subscribe and save

Springer+ Basic
$34.99 /Month
  • Get 10 units per month
  • Download Article/Chapter or eBook
  • 1 Unit = 1 Article or 1 Chapter
  • Cancel anytime
Subscribe now

Buy Now

Chapter
USD 29.95
Price excludes VAT (USA)
  • Available as PDF
  • Read on any device
  • Instant download
  • Own it forever
eBook
USD 39.99
Price excludes VAT (USA)
  • Available as PDF
  • Read on any device
  • Instant download
  • Own it forever
Softcover Book
USD 54.99
Price excludes VAT (USA)
  • Compact, lightweight edition
  • Dispatched in 3 to 5 business days
  • Free shipping worldwide - see info

Tax calculation will be finalised at checkout

Purchases are for personal use only

Institutional subscriptions

Preview

Unable to display preview. Download preview PDF.

Unable to display preview. Download preview PDF.

Similar content being viewed by others

References

  1. Baz, A., Shang, D., Xia, F., Yakovlev, A.: Self-Timed SRAM for Energy Harvesting Systems. In: van Leuken, R., Sicard, G. (eds.) PATMOS 2010. LNCS, vol. 6448, pp. 105–115. Springer, Heidelberg (2011)

    Chapter  Google Scholar 

  2. Baz, A., Shang, D., Xia, F., Yakovlev, A.: Self-Timed SRAM for Energy Harvesting Systems. Journal of Low Power Electronics 7(2), 274–284 (2011)

    Article  Google Scholar 

  3. Gupta, S.K., Raychowdhury, A., Roy, K.: Digital Computation in Subthreshold Region for Ultralow-Power Operation: A Device–Circuit–Architecture Codesign Perspective. Proceedings of the IEEE 98(2), 160–190 (2010)

    Article  Google Scholar 

  4. Qazi, M., Stawiasz, K., Chang, L., Chandrakasan, A.P.: A 512kb 8T SRAM Macro Operating Down to 0.57V With an AC-Coupled Sense Amplifier and Embedded Data-Retention-Voltage Sensor in 45nm SOI CMOS. IEEE Journal of Solid-State Circuits 46(1), 85–96 (2011)

    Article  Google Scholar 

  5. Kulkarni, J.P., Roy, K.: Ultralow-Voltage Process-Variation-Tolerant Schmitt-Trigger-Based SRAM Design. IEEE Transactions on Very Large Scale Integration (VLSI) Systems (not published yet)

    Google Scholar 

  6. Sit, Wing-Yun, V., Choy, C.-S., Chan, C.-F.: A Four-Phase Handshaking Asynchronous Static RAM Design for Self-Timed Systems. IEEE Journal of Solid-State Circuits 34(1), 90–96 (1999)

    Article  Google Scholar 

  7. Dama, J., Lines, A.: GHz Asynchronous SRAM in 65nm. In: Proceedings of Asynchronous Circuits and Systems. In: 15th IEEE Symposium on ASYNC 2009, May 17-20, pp. 85–94 (2009)

    Google Scholar 

  8. Chang, M.-F., Yang, S.-M., Chen, K.-T.: Wide Vdd Embedded Asynchronous SRAM With Dual-Mode Self-Timed Technique for Dynamic Voltage Systems. IEEE Transactions on Circuits and Systems I: Regular Papers 56(8), 1657–1667 (2009)

    Article  Google Scholar 

  9. Noguchi, H., Okumura, S., Iguchi, Y., Fujiwara, H., Morita, Y., Nii, K., Kawaguchi, H., Yoshimoto, M.: Which is the Best Dual-Port SRAM in 45-nm Process Technology? — 8T, 10T single end, and 10T differential —. In: IEEE International Conference on Integrated Circuit Design and Technology and Tutorial, 2008. ICICDT, June 2-4, pp. 55–58 (2008)

    Google Scholar 

  10. Martin, A.J.: The Limitations to Delay-Insensitivity in Asynchronous Circuits. In: Dallyed, W.J. (ed.) Advanced Research in VLSI, pp. 263–278. MIT Press, Cambridge (1990)

    Google Scholar 

  11. Amrutur, B.S., Horowitz, A.: A Replica technique for wordline and sense control in low power SRAM’s. IEEE Journal of Solid-State Circuits 33(8), 1208–1219 (1998)

    Article  Google Scholar 

  12. Sparsø, J., Furber, S.: Principles of Asynchronus Circuit Design: A System Perspective. Kluwer Academic Publishers, Boston (2001)

    Book  Google Scholar 

  13. Chen, Q., Mahmoodi, H., Bhunia, S., Roy, K.: Modeling and Testing of SRAM for New Failure Mechanisms due to Process Variations in nanoscale CMOS. In: Proceedings of the 23rd IEEE VLSI Test Symposium 9VTS 2005 (2005)

    Google Scholar 

  14. Dilillo, L., A1-Hashimi, B.M., Rosinger, P., Girard, P.: Leakage Read Fault in Nanoscale SRAM:Analysis, test and Diagnosis. In: Proceedings of the International Design and Test Workshop, Duday, November 19-20 (2006)

    Google Scholar 

  15. Shang, D., Yakovlev, A., Burns, F., Xia, F., Bystrov, A.: Low Cost Online Testing of Asynchronous Handshakes. In: Proceeding of European Testing Symposium (ETS), May 21-25 (2006)

    Google Scholar 

  16. Cortadella, J., Kishinevsky, M., Kondratyev, A., Lavagno, L., Yakovlev, A.: Petrify: a tool for manipulating concurrent specifications and synthesis of asynchronous controllers. IEICE Transactions on Information and Systems E80-D(3), 315–325 (1997)

    Google Scholar 

Download references

Author information

Authors and Affiliations

Authors

Editor information

Editors and Affiliations

Rights and permissions

Reprints and permissions

Copyright information

© 2011 Springer-Verlag Berlin Heidelberg

About this paper

Cite this paper

Baz, A., Shang, D., Xia, F., Yakovlev, A., Bystrov, A. (2011). Improving the Robustness of Self-timed SRAM to Variable Vdds. In: Ayala, J.L., García-Cámara, B., Prieto, M., Ruggiero, M., Sicard, G. (eds) Integrated Circuit and System Design. Power and Timing Modeling, Optimization, and Simulation. PATMOS 2011. Lecture Notes in Computer Science, vol 6951. Springer, Berlin, Heidelberg. https://doi.org/10.1007/978-3-642-24154-3_4

Download citation

  • DOI: https://doi.org/10.1007/978-3-642-24154-3_4

  • Publisher Name: Springer, Berlin, Heidelberg

  • Print ISBN: 978-3-642-24153-6

  • Online ISBN: 978-3-642-24154-3

  • eBook Packages: Computer ScienceComputer Science (R0)

Publish with us

Policies and ethics