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Power Dissipation Associated to Internal Effect Transitions in Static CMOS Gates

  • Conference paper
Integrated Circuit and System Design. Power and Timing Modeling, Optimization and Simulation (PATMOS 2008)

Abstract

Power modeling techniques have traditionally neglected the main part of the energy consumed in the internal nodes of static CMOS gates: the power dissipated by input transitions that do not produce output switching. In this work, we present an experimental set-up that shows that this power component may contribute up to 59% of the total power consumption of a gate in modern technologies. This fact makes very important to include it into any accurate power model.

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© 2009 Springer-Verlag Berlin Heidelberg

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Millan, A., Juan, J., Bellido, M.J., Guerrero, D., Ruiz-de-Clavijo, P., Viejo, J. (2009). Power Dissipation Associated to Internal Effect Transitions in Static CMOS Gates. In: Svensson, L., Monteiro, J. (eds) Integrated Circuit and System Design. Power and Timing Modeling, Optimization and Simulation. PATMOS 2008. Lecture Notes in Computer Science, vol 5349. Springer, Berlin, Heidelberg. https://doi.org/10.1007/978-3-540-95948-9_39

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  • DOI: https://doi.org/10.1007/978-3-540-95948-9_39

  • Publisher Name: Springer, Berlin, Heidelberg

  • Print ISBN: 978-3-540-95947-2

  • Online ISBN: 978-3-540-95948-9

  • eBook Packages: Computer ScienceComputer Science (R0)

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