Abstract
In this study, an alternative approach for combining Fault Trees (FT) and Event Trees (ET) using capabilities of Bayesian networks (BN) for dependency analysis is proposed. We focused on treating implicit and explicit weak s-dependencies that may exist among different static/dynamic FTs related to an ET. In case of combining implicit s-dependent static FTs and ET that combinatorial approaches fail to get the exact result, the proposed approach is accurate and more efficient than using Markov Chain (MC) based approaches. In case of combining implicit weak s-dependent dynamic FTs and ET where the effect of implicit s-dependencies have to be manually inserted into the MC, the proposed approach is more efficient for getting an acceptable result.
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References
Kumamoto, H., Henley, E.J.: Probabilistic risk assessment and management for engineers and scientists. IEEE press, New York (1996)
Manian, R., Dugan, J.B., Coppit, D., Sulivan, K.: Combining various solution techniques for dynamic fault tree analysis of computer systems. In: Proc. 3rd Intl high-assurance systems engineering symposium, Washington D.C., pp. 21–28 (1998)
Barlow, R., Proshan, F.: Mathematical theory of reliability. SIAM, Philadelphia (1996)
Andrews, J.D., Dunnett, S.J.: Event tree analysis using binary decision diagrams. IEEE Transactions on Reliability 49, 230–238 (2000)
Boudali, H., Dugan, J.B.: A discrete-time Bayesian network reliability modeling and analysis framework. Reliability Engineering and System Safety 87, 337–349 (2005)
Jensen, F.V.: An introduction to Bayesian Networks. Springer, New York (1996)
Pearl, J.: Probabilistic reasoning in intelligent systems. Morgan Kaufman, California (1988)
Bobbio, A., Portinale, L., Minichino, M., Ciancamerla, E.: Improving the Analysis of dependable Systems by Mapping Fault Trees into Bayesian Networks. Reliability Engineering and System Safety 71, 249–260 (2001)
Dutuit, Y., Rauzy, A.: A linear time algorithm to find modules of fault trees. IEEE Transactions on Reliability 45, 422–425 (1996)
Sullivan, K.J., Dugan, J.B., Coppit, D.: The Galileo fault tree analysis tool. In: 29th Annual International Symposium on Fault-Tolerant Computing, pp. 232–235 (1999)
Jensen, F.V., Chamberlain, B., Nordahl, T., Jensen, F.: Analysis in Hugin of data conflict. In: Bonissone, P.P., Henrion, M., Kanal, L.N., Lemmer, J.F. (eds.) Uncertainty in Artificial Intelligence, vol. 6, pp. 519–528. Elsevier Science Publishers, Amsterdam, The Netherlands (1991)
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Hosseini, S.M.H., Takahashi, M. (2007). Combining Static/Dynamic Fault Trees and Event Trees Using Bayesian Networks. In: Saglietti, F., Oster, N. (eds) Computer Safety, Reliability, and Security. SAFECOMP 2007. Lecture Notes in Computer Science, vol 4680. Springer, Berlin, Heidelberg. https://doi.org/10.1007/978-3-540-75101-4_10
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DOI: https://doi.org/10.1007/978-3-540-75101-4_10
Publisher Name: Springer, Berlin, Heidelberg
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