Abstract
One of the important tasks during software testing is the generation of test cases. Unfortunately, existing approaches to test case generation often have problems limiting their use. A problem of dynamic test case generation approaches, for instance, is that a large number of iterations can be necessary to obtain test cases. This article introduces a formal framework for the application of the well-known search strategy of binary search in path-oriented test case generation and explains the binary search-based test case generation (BINTEST) algorithm.
The chair of Applied Telematics / e-Business is endowed by Deutsche Telekom AG.
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Beydeda, S., Gruhn, V. (2003). Test Case Generation According to the Binary Search Strategy. In: Yazıcı, A., Şener, C. (eds) Computer and Information Sciences - ISCIS 2003. ISCIS 2003. Lecture Notes in Computer Science, vol 2869. Springer, Berlin, Heidelberg. https://doi.org/10.1007/978-3-540-39737-3_124
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DOI: https://doi.org/10.1007/978-3-540-39737-3_124
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