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A Fabric Defect Detection Model Based on Feature Extraction of Weak Sample Scene

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Advances in Swarm Intelligence (ICSI 2023)

Part of the book series: Lecture Notes in Computer Science ((LNCS,volume 13969))

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Abstract

Defect detection of fabrics is a necessary step for quality control in industries related to fabrics such as clothing and tents. Traditional fabric inspection relies on visual inspection, which is inefficient and inaccurate. The abnormal detection model based on PatchCore is based on the feature extraction of a pre-trained model on the general ImageNet large data set and performs well in industrial abnormal detection tasks. However, it is difficult to adapt to the noise problem of factory fabrics and scene adaptability. Therefore, in this paper, feature extraction is scenarized, and a small amount of real fabric data is used to fine-tune the pre-trained feature extraction network guided by object detection. This allows it to adapt to real industrial fabric abnormal detection scenes, and the scoring function is optimized to improve segmentation accuracy for noise problems. This solves the problem of insufficient fabric defect samples and the speed and accuracy requirements of defect detection in industrial scenes. The deployment and testing in the factory have effectively solved the problem of fabric detection in industrial scenes.

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References

  1. Ngan, H.Y.T., Pang, G.K.H., Yung, N.H.C.: Automated fabric defect detection—a review. Image Vis. Comput. 29, 442–458 (2011)

    Article  Google Scholar 

  2. Zhou, J., Wang, J.: Unsupervised fabric defect segmentation using local patch approximation. J. Text. Inst. 107, 800–809 (2016)

    Article  Google Scholar 

  3. Kirchler, M., et al.: TransferGWAS: GWAS of images using deep transfer learning (2021). https://doi.org/10.1101/2021.10.22.465430

  4. Heaton, J.: Ian Goodfellow, Yoshua Bengio, and Aaron Courville: Deep learning. Genet. Program Evolvable Mach. 19(1–2), 305–307 (2017). https://doi.org/10.1007/s10710-017-9314-z

    Article  Google Scholar 

  5. Honeycutt, C.E., Plotnick, R.: Image analysis techniques and gray-level co-occurrence matrices (GLCM) for calculating bioturbation indices and characterizing biogenic sedimentary structures. Comput. Geosci. 34, 1461–1472 (2008)

    Article  Google Scholar 

  6. Guo, Z., Zhang, L., Zhang, D.: Rotation invariant texture classification using LBP variance (LBPV) with global matching. Pattern Recogn. 43, 706–719 (2010)

    Article  MATH  Google Scholar 

  7. Unser, M.: Sum and difference histograms for texture classification. IEEE Trans. Pattern Anal. Mach. Intel. (PAMI) 8, 118–125 (1986)

    Google Scholar 

  8. Gonzalez, R.C., et al.: Digital image processing, third edition. J. Biomed. Opt. 14(2), 029901 (2009). https://doi.org/10.1117/1.3115362

  9. Liu, C., Gryllias, K.: A deep support vector data description method for anomaly detection in helicopters. In: PHM Society European Conference, p. 9 (2021)

    Google Scholar 

  10. Liang, S., Li, Y., Srikant, R.: Enhancing the reliability of out-of-distribution image detection in neural networks. arXiv: Learning (2017)

    Google Scholar 

  11. Vincent, P., et al.: Extracting and composing robust features with denoising autoencoders. Presented at the (2008). https://doi.org/10.1145/1390156.1390294

  12. Choi, Y., et al.: StarGAN: unified generative adversarial networks for multi-domain image-to-image translation. Presented at the (2018). https://doi.org/10.1109/cvpr.2018.00916

  13. Fujioka, T., et al.: Efficient anomaly detection with generative adversarial network for breast ultrasound imaging. Diagnostics 10( 7), 456 (2020). https://doi.org/10.3390/diagnostics10070456

  14. Defard, T., Setkov, A., Loesch, A., Audigier, R.: PaDiM: a patch distribution modeling framework for anomaly detection and localization. In: Del Bimbo, A., et al. (eds.) ICPR 2021. LNCS, vol. 12664, pp. 475–489. Springer, Cham (2021). https://doi.org/10.1007/978-3-030-68799-1_35

    Chapter  Google Scholar 

  15. Roth, K., et al.: Towards Total Recall in Industrial Anomaly Detection. Presented at the (2022). https://doi.org/10.1109/cvpr52688.2022.01392

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Acknowledgments

This work was supported by the project “Research on Key AI Visual Technologies Based on Deep Learning and Their Industrial Application in Industrial Scenarios” of Quzhou Science and Technology Bureau.

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Correspondence to Mengtian Wang .

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Wang, M., Wang, M., Liu, J., Niu, S., Zhang, W., Zhao, J. (2023). A Fabric Defect Detection Model Based on Feature Extraction of Weak Sample Scene. In: Tan, Y., Shi, Y., Luo, W. (eds) Advances in Swarm Intelligence. ICSI 2023. Lecture Notes in Computer Science, vol 13969. Springer, Cham. https://doi.org/10.1007/978-3-031-36625-3_20

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  • DOI: https://doi.org/10.1007/978-3-031-36625-3_20

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  • Publisher Name: Springer, Cham

  • Print ISBN: 978-3-031-36624-6

  • Online ISBN: 978-3-031-36625-3

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