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A Novel Test Coverage Metric for Concurrently-Accessed Software Components

  • Conference paper
Formal Approaches to Software Testing (FATES 2005)

Part of the book series: Lecture Notes in Computer Science ((LNPSE,volume 3997))

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Abstract

We propose a novel, practical coverage metric called “location pairs” (LP) for concurrently-accessed software components. The LP metric captures well common concurrency errors that lead to atomicity or refinement violations. We describe a software tool for measuring LP coverage and outline an inexpensive application of predicate abstraction and model checking for ruling out infeasible coverage targets.

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© 2006 Springer-Verlag Berlin Heidelberg

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Tasiran, S., Elmas, T., Bolukbasi, G., Keremoglu, M.E. (2006). A Novel Test Coverage Metric for Concurrently-Accessed Software Components. In: Grieskamp, W., Weise, C. (eds) Formal Approaches to Software Testing. FATES 2005. Lecture Notes in Computer Science, vol 3997. Springer, Berlin, Heidelberg. https://doi.org/10.1007/11759744_5

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  • DOI: https://doi.org/10.1007/11759744_5

  • Publisher Name: Springer, Berlin, Heidelberg

  • Print ISBN: 978-3-540-34454-4

  • Online ISBN: 978-3-540-34455-1

  • eBook Packages: Computer ScienceComputer Science (R0)

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