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"Robust Inference for One-Shot Device Testing Data Under Weibull Lifetime ..."

Narayanaswamy Balakrishnan et al. (2020)

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DOI: 10.1109/TR.2019.2954385

access: closed

type: Journal Article

metadata version: 2020-09-19

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  - journals/tr/BalakrishnanCMP20
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  - https://dblp.org/rec/journals/tr/BalakrishnanCMP20
Narayanaswamy Balakrishnan, Elena Castilla, Nirian Martín, Leandro Pardo:
Robust Inference for One-Shot Device Testing Data Under Weibull Lifetime Model. IEEE Trans. Reliab. 69(3): 937-953 (2020)

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