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"Condition Monitoring of SiC MOSFETs Based on Gate-Leakage Current Estimation."

Patrick Wang et al. (2022)

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DOI: 10.1109/TIM.2021.3137866

access: open

type: Journal Article

metadata version: 2023-07-27

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  - https://dblp.org/rec/journals/tim/WangZBD22
Patrick Wang, Joseph Zatarski, Arijit Banerjee, John S. Donnal:
Condition Monitoring of SiC MOSFETs Based on Gate-Leakage Current Estimation. IEEE Trans. Instrum. Meas. 71: 1-10 (2022)

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