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"Measurement Models for Psychological Attributes: by Klaas Sijtsma, and ..."

Stan Lipovetsky (2022)

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DOI: 10.1080/00401706.2022.2087424

access: closed

type: Journal Article

metadata version: 2022-10-20

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Stan Lipovetsky:
Measurement Models for Psychological Attributes: by Klaas Sijtsma, and Andries L. van der Ark, Boca Raton, FL, CRC Press, Taylor & Francis Group, Chapman and Hall, 2020, 428 pp., 50 b/w illustrations, $79.95 (pbk), ISBN 978-0-367-42452-7. Technometrics 64(3): 426-429 (2022)

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