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"A New Logic Topology-Based Scan Chain Stitching for Test-Power Reduction."

Sangjun Lee et al. (2020)

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DOI: 10.1109/TCSII.2020.3004371

access: closed

type: Journal Article

metadata version: 2024-02-27

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  - https://dblp.org/rec/journals/tcas/LeeCCK20
Sangjun Lee, Kyunghwan Cho, Sungki Choi, Sungho Kang:
A New Logic Topology-Based Scan Chain Stitching for Test-Power Reduction. IEEE Trans. Circuits Syst. 67-II(12): 3432-3436 (2020)

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