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"Method of diagnosing multiple stuck-at-faults in combinational circuits."

Teruhiko Yamada et al. (1991)

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DOI: 10.1002/SCJ.4690221103

access: closed

type: Journal Article

metadata version: 2023-09-13

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  - journals/scjapan/YamadaHMTN91
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  - https://dblp.org/rec/journals/scjapan/YamadaHMTN91
Teruhiko Yamada, Shuji Hamada, Tatsuo Matsumoto, Toshihiko Takahashi, Takao Nakayama:
Method of diagnosing multiple stuck-at-faults in combinational circuits. Syst. Comput. Jpn. 22(11): 21-30 (1991)

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