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"Defect detection and modelling using pulsed electrical stress for ..."

Cezary Sydlo et al. (2001)

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DOI: 10.1016/S0026-2714(01)00184-6

access: closed

type: Journal Article

metadata version: 2020-03-27

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  - https://dblp.org/rec/journals/mr/SydloMGHKDCCFB01
Cezary Sydlo, Bastian Mottet, Husin Ganis, Hans L. Hartnagel, Viktor Krozer, Sylvain L. Delage, Simone Cassette, Eric Chartier, D. Floriot, Steven Bland:
Defect detection and modelling using pulsed electrical stress for reliability investigations of InGaP HBT. Microelectron. Reliab. 41(9-10): 1567-1571 (2001)

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