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"Low-frequency noise in hot-carrier degraded nMOSFETs."

Cora Salm et al. (2007)

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DOI: 10.1016/J.MICROREL.2007.01.044

access: closed

type: Journal Article

metadata version: 2021-10-14

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  - https://dblp.org/rec/journals/mr/SalmHKHWS07
Cora Salm, Eric Hoekstra, Jay S. Kolhatkar, André J. Hof, Hans Wallinga, Jurriaan Schmitz:
Low-frequency noise in hot-carrier degraded nMOSFETs. Microelectron. Reliab. 47(4-5): 577-580 (2007)

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