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"A digital technique for diagnosing interconnect degradation by using ..."

Jinwoo Lee, Daeil Kwon (2017)

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DOI: 10.1016/J.MEJO.2016.12.008

access: closed

type: Journal Article

metadata version: 2020-02-22

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Jinwoo Lee, Daeil Kwon:
A digital technique for diagnosing interconnect degradation by using digital signal characteristics. Microelectron. J. 60: 87-93 (2017)

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