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"On-chip structures for timing measurement and test."

D. J. Kinniment et al. (2003)

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DOI: 10.1016/S0141-9331(03)00096-6

access: closed

type: Journal Article

metadata version: 2023-09-30

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  - https://dblp.org/rec/journals/mam/KinnimentMBRY03
D. J. Kinniment, Oleh V. Maevsky, Alexandre V. Bystrov, Gordon Russell, Alexandre Yakovlev:
On-chip structures for timing measurement and test. Microprocess. Microsystems 27(9): 473-483 (2003)

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