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"Single Event Multiple Upset (SEMU) Tolerant Latch Designs in Presence of ..."

Ramin Rajaei, Mahmoud Tabandeh, Mahdi Fazeli (2015)

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DOI: 10.1142/S0218126615500073

access: closed

type: Journal Article

metadata version: 2020-08-25

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Ramin Rajaei, Mahmoud Tabandeh, Mahdi Fazeli:
Single Event Multiple Upset (SEMU) Tolerant Latch Designs in Presence of Process and Temperature Variations. J. Circuits Syst. Comput. 24(1): 1550007:1-1550007:30 (2015)

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