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"Correlations between BTI-Induced Degradations and Process Variations on ..."

Michitarou Yabuuchi, Ryo Kishida, Kazutoshi Kobayashi (2014)

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DOI: 10.1587/TRANSFUN.E97.A.2367

access: closed

type: Journal Article

metadata version: 2020-04-11

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  - https://dblp.org/rec/journals/ieicet/YabuuchiKK14
Michitarou Yabuuchi, Ryo Kishida, Kazutoshi Kobayashi:
Correlations between BTI-Induced Degradations and Process Variations on ASICs and FPGAs. IEICE Trans. Fundam. Electron. Commun. Comput. Sci. 97-A(12): 2367-2372 (2014)

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