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"Evaluating fault coverage of bulk built-in current sensor for soft errors ..."

Egas Henes Neto et al. (2005)

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DOI: 10.1145/1081081.1081103

access: closed

type: Conference or Workshop Paper

metadata version: 2018-11-06

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Egas Henes Neto, Ivandro Ribeiro, Michele G. Vieira, Gilson I. Wirth, Fernanda Lima Kastensmidt:
Evaluating fault coverage of bulk built-in current sensor for soft errors in combinational and sequential logic. SBCCI 2005: 62-67

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