default search action

combined dblp search
author search
venue search
publication search

ask others

"Embedding Test Patterns in Accumulator-Generated Sequences in O(1) Time."

Nestor Ioannidis, Ioannis Voyiatzis (2009)

> Home

Details and statistics

DOI: 10.1109/PCI.2009.41

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-23

- view
  authority control:
- export record
  dblp key:
  - conf/pci/IoannidisV09
- ask others
- share record
  persistent URL:
  - https://dblp.org/rec/conf/pci/IoannidisV09
Nestor Ioannidis, Ioannis Voyiatzis:
Embedding Test Patterns in Accumulator-Generated Sequences in O(1) Time. Panhellenic Conference on Informatics 2009: 55-59

manage site settings

To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.