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"Adaptive test flow for mixed-signal/RF circuits using learned information ..."

Ender Yilmaz, Sule Ozev, Kenneth M. Butler (2010)

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DOI: 10.1109/TEST.2010.5699271

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-23

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Ender Yilmaz, Sule Ozev, Kenneth M. Butler:
Adaptive test flow for mixed-signal/RF circuits using learned information from device under test. ITC 2010: 674-683

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