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"Application of Cell-Aware Test on an Advanced 3nm CMOS Technology Library."

Zhan Gao et al. (2019)

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DOI: 10.1109/ITC44170.2019.9000164

access: closed

type: Conference or Workshop Paper

metadata version: 2024-02-05

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  dblp key:
  - conf/itc/GaoMHSBHCGM19
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  - https://dblp.org/rec/conf/itc/GaoMHSBHCGM19
Zhan Gao, Santosh Malagi, Min-Chun Hu, Joe Swenton, Rogier Baert, Jos Huisken, Bilal Chehab, Kees Goossens, Erik Jan Marinissen:
Application of Cell-Aware Test on an Advanced 3nm CMOS Technology Library. ITC 2019: 1-6

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