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"Non-invasive RF built-in testing using on-chip temperature sensors."

Eduardo Aldrete-Vidrio et al. (2009)

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DOI: 10.1109/TEST.2009.5355901

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-23

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  dblp key:
  - conf/itc/Aldrete-VidrioOAMS09
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  - https://dblp.org/rec/conf/itc/Aldrete-VidrioOAMS09
Eduardo Aldrete-Vidrio, Marvin Onabajo, Josep Altet, Diego Mateo, José Silva-Martínez:
Non-invasive RF built-in testing using on-chip temperature sensors. ITC 2009: 1

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