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"Thermally-activated failure mechanisms of 0.25 \ \mu \mathrm{m}$ RF ..."

Zhan Gao et al. (2023)

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DOI: 10.1109/IRPS48203.2023.10118131

access: closed

type: Conference or Workshop Paper

metadata version: 2024-05-07

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  - conf/irps/GaoCRSFMMZ23
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Zhan Gao, Francesca Chiocchetta, Fabiana Rampazzo, Carlo De Santi, Mirko Fornasier, Gaudenzio Meneghesso, Matteo Meneghini, Enrico Zanoni:
Thermally-activated failure mechanisms of 0.25 \ \mu \mathrm{m}$ RF AIGaN/GaN HEMTs submitted to long-term life tests. IRPS 2023: 1-5

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