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"Efficient reuse of domain-specific test knowledge: An industrial case in ..."

Nicolas Devos et al. (2012)

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DOI: 10.1109/ICSE.2012.6227107

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-23

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  - https://dblp.org/rec/conf/icse/DevosPDBMA12
Nicolas Devos, Christophe Ponsard, Jean-Christophe Deprez, Renaud Bauvin, Benedicte Moriau, Guy Anckaerts:
Efficient reuse of domain-specific test knowledge: An industrial case in the smart card domain. ICSE 2012: 1123-1132

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