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"Effective IR-drop reduction in at-speed scan testing using ..."

Kohei Miyase et al. (2008)

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DOI: 10.1109/ICCAD.2008.4681551

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-24

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  - conf/iccad/MiyaseNIHAYFWK08
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  - https://dblp.org/rec/conf/iccad/MiyaseNIHAYFWK08
Kohei Miyase, Kenji Noda, Hideaki Ito, Kazumi Hatayama, Takashi Aikyo, Yuta Yamato, Hiroshi Furukawa, Xiaoqing Wen, Seiji Kajihara:
Effective IR-drop reduction in at-speed scan testing using Distribution-Controlling X-Identification. ICCAD 2008: 52-58

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