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"Trap Dynamic Detection of GaN HEMT under Repetitive Short Circuit Degradation."

Wenjuan Mei et al. (2023)

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DOI: 10.1109/I2MTC53148.2023.10176003

access: closed

type: Conference or Workshop Paper

metadata version: 2023-07-25

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  dblp key:
  - conf/i2mtc/MeiPLSMZ23
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  - https://dblp.org/rec/conf/i2mtc/MeiPLSMZ23
Wenjuan Mei, Chaowu Pan, Zhen Liu, Yuanzhang Su, Yusong Mei, Qi Zhou:
Trap Dynamic Detection of GaN HEMT under Repetitive Short Circuit Degradation. I2MTC 2023: 1-6

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