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"Tech Pains: Characterizations of Lived Cybersecurity Experiences."

Huixin Tian et al. (2020)

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DOI: 10.1109/EUROSPW51379.2020.00040

access: closed

type: Conference or Workshop Paper

metadata version: 2024-10-06

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Huixin Tian, Chris Kanich, Jason Polakis, Sameer Patil:
Tech Pains: Characterizations of Lived Cybersecurity Experiences. EuroS&P Workshops 2020: 250-259

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