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"Robust polysilicon gate FinFET SRAM design using dynamic back-gate bias."

Behzad Ebrahimi, Ali Afzali-Kusha, Nader Sehatbakhsh (2013)

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DOI: 10.1109/DTIS.2013.6527801

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-21

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Behzad Ebrahimi, Ali Afzali-Kusha, Nader Sehatbakhsh:
Robust polysilicon gate FinFET SRAM design using dynamic back-gate bias. DTIS 2013: 171-172

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