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"Analysis of BTI in 300 mm integrated dual-gate WS2 FETs."

L. Panarella et al. (2022)

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DOI: 10.1109/DRC55272.2022.9855819

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-28

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  dblp key:
  - conf/drc/PanarellaSVSCAK22
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  - https://dblp.org/rec/conf/drc/PanarellaSVSCAK22
L. Panarella, Quentin Smets, Devin Verreck, Tom Schram, Daire Cott, I. Asselberghs, Ben Kaczer:
Analysis of BTI in 300 mm integrated dual-gate WS2 FETs. DRC 2022: 1-2

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