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"Reliable PUF design using failure patterns from time-controlled power gating."

Xiaolin Xu, Daniel E. Holcomb (2016)

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DOI: 10.1109/DFT.2016.7684085

access: closed

type: Conference or Workshop Paper

metadata version: 2024-11-08

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  dblp key:
  - conf/dft/XuH16
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  persistent URL:
  - https://dblp.org/rec/conf/dft/XuH16
Xiaolin Xu, Daniel E. Holcomb:
Reliable PUF design using failure patterns from time-controlled power gating. DFT 2016: 135-140

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