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"Test data compression technique using selective don't-care identification."

Terumine Hayashi et al. (2004)

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DOI: 10.1109/ASPDAC.2004.191

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-23

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  dblp key:
  - conf/aspdac/HayashiYSKT04
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  persistent URL:
  - https://dblp.org/rec/conf/aspdac/HayashiYSKT04
Terumine Hayashi, Haruna Yoshioka, Tsuyoshi Shinogi, Hidehiko Kita, Haruhiko Takase:
Test data compression technique using selective don't-care identification. ASP-DAC 2004: 230-233

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