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"Effectiveness Comparisons of Outlier Screening Methods for Frequency ..."

Brady Benware et al. (2003)

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DOI: 10.1109/VTEST.2003.1197631

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-24

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  - https://dblp.org/rec/conf/vts/BenwareMLD03
Brady Benware, Robert Madge, Cam Lu, W. Robert Daasch:
Effectiveness Comparisons of Outlier Screening Methods for Frequency Dependent Defects on Complex ASICs. VTS 2003: 39-46

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