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"Thermal Considerations for Block-Level PPA Assessment in Angstrom Era: A ..."

S. Mishra et al. (2024)

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DOI: 10.1109/VLSITECHNOLOGYANDCIR46783.2024.10631358

access: closed

type: Conference or Workshop Paper

metadata version: 2024-10-17

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S. Mishra, Bjorn Vermeersch, Sankatali Venkateswarlu, Halil Kukner, Gioele Mirabelli, Fabian M. Bufler, Moritz Brunion, Dawit Burusie Abdi, Herman Oprins, D. Biswas, Odysseas Zografos, Francky Catthoor, Pieter Weckx, Geert Hellings, James Myers, Julien Ryckaert:
Thermal Considerations for Block-Level PPA Assessment in Angstrom Era: A Comparison Study of Nanosheet FETs (A10) & Complementary FETs (A5). VLSI Technology and Circuits 2024: 1-2

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