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"Delay Fault Coverage Enhancement Using Multiple Test Observation Times."

Wen-Ben Jone, Yun-Pan Ho, Sunil R. Das (1997)

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DOI: 10.1109/ICVD.1997.567970

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-24

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  - https://dblp.org/rec/conf/vlsid/JoneHD97
Wen-Ben Jone, Yun-Pan Ho, Sunil R. Das:
Delay Fault Coverage Enhancement Using Multiple Test Observation Times. VLSI Design 1997: 106-110

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