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Marcello Dalpasso
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2020 – today
- 2024
- [j16]Giuseppe Lancia
, Marcello Dalpasso:
Algorithmic strategies for a fast exploration of the TSP 4-OPT neighborhood. J. Heuristics 30(3-4): 109-144 (2024) - 2023
- [i1]Giuseppe Lancia, Marcello Dalpasso:
Orbits, schemes and dynamic programming procedures for the TSP 4-OPT neighborhood. CoRR abs/2303.14424 (2023) - 2020
- [j15]Giuseppe Lancia
Finding the Best 3-OPT Move in Subcubic Time. Algorithms 13(11): 306 (2020)
2010 – 2019
- 2019
- [j14]Giuseppe Lancia
FASTSET: A Fast Data Structure for the Representation of Sets of Integers. Algorithms 12(5): 91 (2019) - [c17]Giuseppe Lancia
Speeding-Up the Dynamic Programming Procedure for the Edit Distance of Two Strings. DEXA Workshops 2019: 59-66 - 2018
- [c16]Marcello Dalpasso
A Boolean model for delay fault testing of emerging digital technologies based on ambipolar devices. DATE 2018: 297-300 - [c15]Marcello Dalpasso
New Modeling Ideas for the Exact Solution of the Closest String Problem. DEXA Workshops 2018: 105-114 - 2016
- [j13]Michele Favalli, Marcello Dalpasso
Boolean and Pseudo-Boolean Test Generation for Feedback Bridging Faults. IEEE Trans. Computers 65(3): 706-715 (2016) - 2015
- [j12]Marcello Dalpasso
Estimating the strength of poker hands by integer linear programming techniques. Central Eur. J. Oper. Res. 23(3): 625-640 (2015) - 2014
- [j11]Michele Favalli
Applications of Boolean Satisfiability to Verification and Testing of Switch-Level Circuits. J. Electron. Test. 30(1): 41-55 (2014) - [j10]L. Valenti, Marcello Dalpasso
Efficient testing of multi-output combinational cells in nano-complementary metal oxide semiconductor integrated circuits. IET Comput. Digit. Tech. 8(2): 83-89 (2014)
2000 – 2009
- 2009
- [j9]Michele Favalli
How Many Test Vectors We Need to Detect a Bridging Fault? J. Electron. Test. 25(1): 79-95 (2009) - 2007
- [c14]Michele Favalli
High Quality Test Vectors for Bridging Faults in the Presence of IC's Parameters Variations. DFT 2007: 448-456 - 2005
- [c13]Marcello Dalpasso
The String Barcoding Problem is NP-Hard. Comparative Genomics 2005: 88-96 - 2002
- [j8]Marcello Dalpasso, Alessandro Bogliolo
Virtual Simulation of Distributed IP-Based Designs. IEEE Des. Test Comput. 19(5): 92-104 (2002) - [j7]Michele Favalli
Bridging fault modeling and simulation for deep submicron CMOS ICs. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 21(8): 941-953 (2002) - [c12]Michele Favalli
An Evolutionary Approach to the Design of On-Chip Pseudorandom Test Pattern Generators. DATE 2002: 1122 - 2000
- [c11]Marcello Dalpasso, Alessandro Bogliolo, Luca Benini:
Hardware/software IP protection. DAC 2000: 593-596 - [c10]Marcello Dalpasso
Virtual Fault Simulation of Distributed IP-Based Designs. DATE 2000: 99-103
1990 – 1999
- 1999
- [c9]Marcello Dalpasso, Alessandro Bogliolo, Luca Benini:
Virtual Simulation of Distributed IP-based Designs. DAC 1999: 50-55 - [c8]Marcello Dalpasso
Specification and Validation of Distributed IP-Based Designs with JavaCAD. DATE 1999: 684-688 - 1998
- [j6]Piero Olivo, Marcello Dalpasso
A Bist Scheme for Non-Volatile Memories. J. Electron. Test. 12(1-2): 139-144 (1998) - 1997
- [j5]Michele Favalli, Marcello Dalpasso
Symbolic Handling of Bridging Fault Effects. J. Electron. Test. 10(3): 271-276 (1997) - [j4]Marcello Dalpasso
A method for increasing the IDDQ testability. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 16(10): 1186-1188 (1997) - 1996
- [j3]Michele Favalli
Modeling and simulation of broken connections in CMOS IC's. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 15(7): 808-814 (1996) - [c7]Piero Olivo, Marcello Dalpasso
Self-Learning Signature Analysis for Non-Volatile Memory Testing. ITC 1996: 303-308 - 1995
- [c6]Marcello Dalpasso
Correlation between IDDQ testing quality and sensor accuracy. ED&TC 1995: 568-572 - [c5]Marcello Dalpasso
Test pattern generation for IDDQ: increasing test quality. VTS 1995: 304-309 - 1994
- [c4]Michele Favalli, Marcello Dalpasso
Modeling of Broken Connections Faults in CMOS ICs. EDAC-ETC-EUROASIC 1994: 159-164 - 1993
- [j2]Marcello Dalpasso
Fault simulation of parametric bridging faults in CMOS IC's. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 12(9): 1403-1410 (1993) - [j1]Michele Favalli
Analysis of resistive bridging fault detection in BiCMOS digital ICs. IEEE Trans. Very Large Scale Integr. Syst. 1(3): 342-355 (1993) - [c3]Michele Favalli, Marcello Dalpasso
Analyss of Dynamic Effects of Resistive Bridging Faults in CMOS and BiCMOS Digital ICs. ITC 1993: 865-874 - 1992
- [c2]Michele Favalli, Marcello Dalpasso, Piero Olivo, Bruno Riccò:
Analysis of Steady State Detection of Resistive Bridging Faults in BiCMOS Digital ICs. ITC 1992: 466-475 - [c1]Marcello Dalpasso, Michele Favalli, Piero Olivo, Bruno Riccò:
Parametric Bridging Fault Characterization for the Fault Simulation of Library-Based ICs. ITC 1992: 486-495
Coauthor Index
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