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A. Cruz Serra
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2010 – 2019
- 2012
- [j32]Nuno B. Bras
, José M. Bioucas-Dias
An Alternating Direction Algorithm for Total Variation Reconstruction of Distributed Parameters. IEEE Trans. Image Process. 21(6): 3004-3016 (2012) - 2010
- [j31]F. Corrêa Alegria
Gaussian Jitter-Induced Bias of Sine Wave Amplitude Estimation Using Three-Parameter Sine Fitting. IEEE Trans. Instrum. Meas. 59(9): 2328-2333 (2010) - [j30]Ricardo Queirós
Cross-Correlation and Sine-Fitting Techniques for High-Resolution Ultrasonic Ranging. IEEE Trans. Instrum. Meas. 59(12): 3227-3236 (2010)
2000 – 2009
- 2009
- [j29]F. Corrêa Alegria
Precision of Independently Based Gain and Offset Error of an ADC Using the Histogram Method. IEEE Trans. Instrum. Meas. 58(3): 512-521 (2009) - [j28]Tomás Radil, Pedro M. Ramos
New Spectrum Leakage Correction Algorithm for Frequency Estimation of Power System Signals. IEEE Trans. Instrum. Meas. 58(5): 1670-1679 (2009) - [j27]Pedro M. Ramos
Recent Developments on Impedance Measurements With DSP-Based Ellipse-Fitting Algorithms. IEEE Trans. Instrum. Meas. 58(5): 1680-1689 (2009) - [j26]Shahram Shariat-Panahi, Francisco André Corrêa Alegria
IEEE 1057 Jitter Test of Waveform Recorders. IEEE Trans. Instrum. Meas. 58(7): 2234-2244 (2009) - [j25]F. Corrêa Alegria
The Histogram Test of ADCs With Sinusoidal Stimulus Is Unbiased by Phase Noise. IEEE Trans. Instrum. Meas. 58(11): 3847-3854 (2009) - 2008
- [j24]Pedro M. Ramos
Impedance measurement using multiharmonic least-squares waveform fitting algorithm. Comput. Stand. Interfaces 30(5): 323-328 (2008) - [j23]Tomás Radil, Pedro M. Ramos
Impedance Measurement With Sine-Fitting Algorithms Implemented in a DSP Portable Device. IEEE Trans. Instrum. Meas. 57(1): 197-204 (2008) - [j22]Tomás Radil, Pedro M. Ramos
PQ Monitoring System for Real-Time Detection and Classification of Disturbances in a Single-Phase Power System. IEEE Trans. Instrum. Meas. 57(8): 1725-1733 (2008) - 2007
- [j21]Pedro M. Ramos
Least Squares Multiharmonic Fitting: Convergence Improvements. IEEE Trans. Instrum. Meas. 56(4): 1412-1418 (2007) - [j20]F. Corrêa Alegria
Standard Histogram Test Precision of ADC Gain and Offset Error Estimation. IEEE Trans. Instrum. Meas. 56(5): 1527-1531 (2007) - 2006
- [j19]F. Corrêa Alegria
ADC transfer curve types - A review. Comput. Stand. Interfaces 28(5): 553-559 (2006) - [j18]Pedro M. Ramos
Simulation and experimental results of multiharmonic least-squares fitting algorithms applied to periodic signals. IEEE Trans. Instrum. Meas. 55(2): 646-651 (2006) - 2005
- [j17]Francisco André Corrêa Alegria
Effective ADC linearity testing using sinewaves. IEEE Trans. Circuits Syst. I Regul. Pap. 52-I(7): 1267-1275 (2005) - [j16]Francisco André Corrêa Alegria
Uncertainty of ADC random noise estimates obtained with the IEEE 1057 standard test. IEEE Trans. Instrum. Meas. 54(1): 110-116 (2005) - [j15]António Manuel da Cruz Serra, Manuel Fonseca da Silva, Pedro M. Ramos
Combined spectral and histogram analysis for fast ADC testing. IEEE Trans. Instrum. Meas. 54(4): 1617-1623 (2005) - [j14]Francisco André Corrêa Alegria
Overdrive in the ramp histogram test of ADCs. IEEE Trans. Instrum. Meas. 54(6): 2305-2309 (2005) - 2004
- [j13]A. Cruz Serra, F. Corrêa Alegria
Analog-to-digital converter testing - new proposals. Comput. Stand. Interfaces 26(1): 3-13 (2004) - [j12]José Miguel Dias Pereira, P. M. B. Silva Girao
An FFT-based method to evaluate and compensate gain and offset errors of interleaved ADC systems. IEEE Trans. Instrum. Meas. 53(2): 423-430 (2004) - [j11]Francisco André Corrêa Alegria
Performance of data acquisition systems from the user's point of view. IEEE Trans. Instrum. Meas. 53(4): 907-914 (2004) - 2003
- [j10]A. Cruz Serra:
Introduction to the special issue on ADC testing, 6th EuroWorkshop on ADC Modelling and Testing. Comput. Stand. Interfaces 25(1): 1-2 (2003) - [j9]Manuel Fonseca da Silva, A. Cruz Serra:
New methods to improve convergence of sine fitting algorithms. Comput. Stand. Interfaces 25(1): 23-31 (2003) - [j8]Francisco André Corrêa Alegria
Variance of the cumulative histogram of ADCs due to frequency errors. IEEE Trans. Instrum. Meas. 52(1): 69-74 (2003) - [j7]Raul Carneiro Martins
Representation and measurement of nonlinearities in stimulus signals. IEEE Trans. Instrum. Meas. 52(4): 1160-1165 (2003) - 2002
- [j6]Francisco André Corrêa Alegria
Performance analysis of an ADC histogram test using small triangular waves. IEEE Trans. Instrum. Meas. 51(4): 723-729 (2002) - 2001
- [j5]Raul Carneiro Martins
ADC interbit modulation: description, detection and quantification. Comput. Stand. Interfaces 23(1): 47-56 (2001) - [j4]Francisco André Corrêa Alegria
Influence of frequency errors in the variance of the cumulative histogram [in ADC testing]. IEEE Trans. Instrum. Meas. 50(2): 461-464 (2001) - [j3]Pasquale Arpaia
A critical note to IEEE 1057-94 standard on hysteretic ADC dynamic testing. IEEE Trans. Instrum. Meas. 50(4): 941-948 (2001) - 2000
- [j2]Francisco André Corrêa Alegria
Automatic calibration of analog and digital measuring instruments using computer vision. IEEE Trans. Instrum. Meas. 49(1): 94-99 (2000)
1990 – 1999
- 1999
- [j1]Raul Carneiro Martins
Automated ADC characterization using the histogram test stimulated by Gaussian noise. IEEE Trans. Instrum. Meas. 48(2): 471-474 (1999) - 1998
- [c1]Raul Carneiro Martins, António Manuel da Cruz Serra:
The use of a noise stimulus in ADC characterization. ICECS 1998: 457-460
Coauthor Index
aka: F. Corrêa Alegria
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