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Alberto Tosi
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2020 – today
- 2024
- [c10]Davide Moschella, Davide Berretta, Alberto Tosi, Federica A. Villa:
A 64 × 64 SPAD Array For Quantum Ghost Imaging with Integrated TDCs and Event-Driven Readout in a 40 nm CMOS Technology. PRIME 2024: 1-4 - 2023
- [c9]Domenico Ribezzo, Mujtaba Zahidy, Antoine Petitjean, Gianmarco Lemmi, Claudia De Lazzari, Ilaria Vagniluca, Enrico Conca, Alberto Tosi, Tommaso Occhipinti, Francesco Saverio Cataliotti, Leif K. Oxenløwe
, André Xuereb, Davide Bacco
QKD protocol over 100 km long submarine optical fiber assisted by a system-in-package fast-gated InGaAs single photon detector. OFC 2023: 1-3 - [c8]Kevin Andres Herrera Pesantes, Enrico Conca, Simone Riccardo, Fabio Telesca, Fabio Signorelli, Alberto Tosi:
8-Channel Time-of-Flight Single-Photon Detection Module Based on InGaAs/InP SPAD Array. PRIME 2023: 93-96 - 2021
- [j11]Caterina Amendola
A Compact Multi-Distance DCS and Time Domain NIRS Hybrid System for Hemodynamic and Metabolic Measurements. Sensors 21(3): 870 (2021) - [c7]Atul Ingle, Trevor Seets, Mauro Buttafava, Shantanu Gupta, Alberto Tosi, Mohit Gupta, Andreas Velten:
Passive Inter-Photon Imaging. CVPR 2021: 8585-8595 - [i1]Atul Ingle, Trevor Seets, Mauro Buttafava, Shantanu Gupta, Alberto Tosi, Mohit Gupta, Andreas Velten:
Passive Inter-Photon Imaging. CoRR abs/2104.00059 (2021) - 2020
- [j10]Enrico Conca
Large-Area, Fast-Gated Digital SiPM With Integrated TDC for Portable and Wearable Time-Domain NIRS. IEEE J. Solid State Circuits 55(11): 3097-3111 (2020)
2010 – 2019
- 2018
- [j9]Mirko Sanzaro
0.16 µm-BCD Silicon Photomultipliers with Sharp Timing Response and Reduced Correlated Noise. Sensors 18(11): 3763 (2018) - [c6]Vincenzo Sesta
A novel sub-10 ps resolution TDC for CMOS SPAD array. ICECS 2018: 5-8 - 2017
- [c5]Adithya Kumar Pediredla, Mauro Buttafava, Alberto Tosi
Reconstructing rooms using photon echoes: A plane based model and reconstruction algorithm for looking around the corner. ICCP 2017: 1-12 - 2016
- [j8]Danilo Bronzi
Automotive Three-Dimensional Vision Through a Single-Photon Counting SPAD Camera. IEEE Trans. Intell. Transp. Syst. 17(3): 782-795 (2016) - 2014
- [c4]Alberto Tosi
Low dark count rate and low timing jitter InGaAs/InP Single-Photon Avalanche Diode. ESSDERC 2014: 82-85 - 2013
- [j7]Bojan Markovic, Simone Tisa, Federica A. Villa
A High-Linearity, 17 ps Precision Time-to-Digital Converter Based on a Single-Stage Vernier Delay Loop Fine Interpolation. IEEE Trans. Circuits Syst. I Regul. Pap. 60-I(3): 557-569 (2013) - 2012
- [c3]Danilo Bronzi, Federica A. Villa
Low-noise and large-area CMOS SPADs with timing response free from slow tails. ESSDERC 2012: 230-233 - 2011
- [c2]F. Guerrieri, Simone Tisa, Alberto Tosi
Linear arrays of single-photon detectors for photon counting and timing. Sensors, Cameras, and Systems for Industrial, Scientific, and Consumer Applications 2011: 78750N - [c1]Bojan Markovic, Simone Tisa, Alberto Tosi
Monolithic single-photon detectors and time-to-digital converters for picoseconds time-of-flight ranging. Sensors, Cameras, and Systems for Industrial, Scientific, and Consumer Applications 2011: 78750P
2000 – 2009
- 2005
- [b1]Alberto Tosi:
Non-invasive testing of VLSI circuits. Polytechnic University of Milan, Italy, 2005 - [j6]Alberto Tosi
Innovative packaging technique for backside optical testing of wire-bonded chips. Microelectron. Reliab. 45(9-11): 1493-1498 (2005) - [j5]Franco Stellari, Peilin Song, John Hryckowian, Otto A. Torreiter, Steven C. Wilson, Philip Wu, Alberto Tosi
Characterization of a 0.13 mum CMOS Link Chip using Time Resolved Emission (TRE). Microelectron. Reliab. 45(9-11): 1550-1553 (2005) - 2004
- [j4]Alberto Tosi
Implementation of TRE systems into Emission Microscopes. Microelectron. Reliab. 44(9-11): 1529-1534 (2004) - [j3]Alberto Tosi
Current crowding in faulty MOSFET: optical and electrical investigation. Microelectron. Reliab. 44(9-11): 1577-1581 (2004) - [j2]Franco Stellari, Alberto Tosi
CMOS circuit testing via time-resolved luminescence measurements and simulations. IEEE Trans. Instrum. Meas. 53(1): 163-169 (2004) - 2003
- [j1]Alberto Tosi
Backside Flip-Chip testing by means of high-bandwidth luminescence detection. Microelectron. Reliab. 43(9-11): 1669-1674 (2003)
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