default search action
P. Srinivasan 0002
Person information
- affiliation: Globalfoundries Inc., Malta, NY, USA
- affiliation (former): New Jersey Institute of Technology, Newark, NJ, USA
Other persons with the same name
- P. Srinivasan — disambiguation page
- P. Srinivasan 0001 — Graz University of Technology, Austria
- P. Srinivasan 0003 (aka: Srinivasan P 0003) — National Institute of Technology, Department of Physics, Silchar, Assam, India
Refine list
refinements active!
zoomed in on ?? of ?? records
view refined list in
export refined list as
2020 – today
- 2024
- [c24]P. Srinivasan, Oscar H. Gonzalez, Oscar D. Restrepo, J. Lestage, Shafi Syed, W. Taylor, Anirban Bandyopadhyay, Martin Gall, S. Ludvik:
Thermal Considerations on RF Reliability and Aging in SOI CMOS Based Power Amplifiers. IRPS 2024: 1-6 - [c23]Alan Y. Otero-Carrascal, Dora A. Chaparro-Ortiz, Edmundo A. Gutiérrez-D., Reydezel Torres-Torres, Oscar Huerta-Gonzalez, P. Srinivasan:
Assessing Non-Conducting Off-State Induced Hard Breakdown for PD-SOI MOSFETs using an RF Measurement Technique. IRPS 2024: 53 - 2023
- [c22]Dora A. Chaparro-Ortiz, Alan Y. Otero-Carrascal, Edmundo A. Gutiérrez-D.
, Reydezel Torres-Torres, Oscar Huerta-Guevara, P. Srinivasan, Fernando Guarin:
Impact of Non-Conducting HCI Degradation on Small-Signal Parameters in RF SOI MOSFET. IRPS 2023: 1-6 - [c21]Aarti Rathi, Abhisek Dixit, Naga Satish, P. Srinivasan, Fernando Guarin:
Reliability of SPST Series-stacked SOI CMOS RF Switches for mmWave Applications. IRPS 2023: 1-6 - [c20]P. Srinivasan, J. Lestage, Shafi Syed, X. Hui, Stephen Moss, Oscar D. Restrepo, Oscar H. Gonzalez, Y. Chen, T. McKay, Anirban Bandyopadhyay, Ned Cahoon, Fernando Guarin, Byoung Min, Martin Gall, S. Ludvik:
RF long term aging behavior and reliability in 22FDX WiFi Power Amplifier designs for 5G applications. IRPS 2023: 1-6 - 2022
- [c19]Aarti Rathi, Abhisek Dixit
RF Reliability of CMOS-Based Power Amplifier Cell for 5G mmWave Applications. IRPS 2022: 4 - [c18]P. Srinivasan
Excellent RF Product HTOL reliability of 5G mmWave beamformer chip fabricated using GF 45RFSOI technologies. IRPS 2022: 4 - [c17]M. Hauser, P. Srinivasan, A. Vallett, R. Krishnasamy, Fernando Guarin, Dave Brochu, V. Pham, Byoung Min:
Parasitic Drain Series Resistance Effects on Non-conducting Hot Carrier Reliability. IRPS 2022: 5 - [c16]Asifa Amin, Aarti Rathi, Sujit K. Singh, Abhisek Dixit
Deep Cryogenic Temperature TDDB in 45-nm PDSOI N-channel FETs for Quantum Computing Applications. IRPS 2022: 11 - [c15]Ned Cahoon, P. Srinivasan, Fernando Guarin:
6G Roadmap for Semiconductor Technologies: Challenges and Advances. IRPS 2022: 11 - [c14]Salvatore Cimino, J. Singh, Jeffrey B. Johnson, W. Zheng, Y. Chen, W. Liu, P. Srinivasan, O. Gonzales, M. Hauser, Matthew Koskinen, K. Nagahiro, Y. Liu, B. Min, Tanya Nigam, N. Squib:
Optimized LDMOS Offering for Power Management and RF Applications. IRPS 2022: 57-1 - 2021
- [c13]Sameer H. Jain, Dimitri Lederer, Arvind Kumar, Sudesh Saroop, Chris Prindle, P. Srinivasan
Novel mmWave NMOS Device for High Pout mmWave Power Amplifiers in 45RFSOI. ESSDERC 2021: 199-202 - [c12]Aarti Rathi, P. Srinivasan
Large Signal RF Reliability of 45-nm RFSOI Power Amplifier Cell for Wi-Fi6 Applications. IRPS 2021: 1-6 - [c11]P. Srinivasan
CMOS RF reliability for 5G mmWave applications - Challenges and Opportunities. IRPS 2021: 1-7 - [c10]P. Srinivasan
RF Reliability of SOI-based Power Amplifier FETs for mmWave 5G Applications. IRPS 2021: 1-6 - [c9]P. Srinivasan
Back gate bias effect and layout dependence on Random Telegraph Noise in FDSOI technologies. IRPS 2021: 1-4 - 2020
- [c8]Paul Colestock, P. Srinivasan, Fernando Guarin:
Silicon Based RF Reliability Challenges for 5G Communications. IRPS 2020: 1-4 - [c7]P. Srinivasan, Paul Colestock, Thomas Samuels, Stephen Moss, Fernando Guarin, Byoung Min:
A novel methodology to evaluate RF reliability for SOI CMOS-based Power Amplifier mmWave applications. IRPS 2020: 1-4
2010 – 2019
- 2019
- [c6]M. Iqbal Mahmud, Amit Gupta, Maria Toledano-Luque, N. Rao Mavilla, Jeffrey B. Johnson, P. Srinivasan
Hot Carrier Reliability Improvement of Thicker Gate Oxide nFET Devices in Advanced FinFETs. IRPS 2019: 1-6 - [c5]Tian Shen, Abu Naser Zainuddin, Purushothaman Srinivasan, Zakariae Chbili, Kai Zhao, Patrick Justison:
Novel Oxide Top-Off Process Enabling Reliable PC-CA TDDB on IO Devices with Self Aligned Contact. IRPS 2019: 1-5 - 2017
- [j3]Shimpei Yamaguchi
Effective work-function control technique applicable to p-type FinFET high-k/metal gate devices. Microelectron. Reliab. 72: 80-84 (2017) - 2013
- [c4]Dalton M. Colombo
Voltage reference design using 1 V power supply in 0.13 µm CMOS technology. LASCAS 2013: 1-4 - 2012
- [j2]Gilson I. Wirth
Compact modeling and simulation of Random Telegraph Noise under non-stationary conditions in the presence of random dopants. Microelectron. Reliab. 52(12): 2955-2961 (2012) - 2011
- [c3]Purushothaman Srinivasan:
Noise and reliability in advanced CMOS devices for low power applications. SBCCI 2011: 228 - 2010
- [j1]Purushothaman Srinivasan
Tool wear monitoring using artificial neural network based on extended Kalman filter weight updation with transformed input patterns. J. Intell. Manuf. 21(6): 717-730 (2010)
2000 – 2009
- 2009
- [c2]P. Srinivasan
Correlating op-amp circuit noise with device flicker (1/f) noise for analog design applications. SoCC 2009: 191-194 - 2004
- [c1]P. Srinivasan, B. Vootukuru, Durga Misra:
Screening of Hot Electron Effect During Plasma Processing. VLSI Design 2004: 291-
Coauthor Index
manage site settings
To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.
Unpaywalled article links
Add open access links from to the list of external document links (if available).
Privacy notice: By enabling the option above, your browser will contact the API of unpaywall.org to load hyperlinks to open access articles. Although we do not have any reason to believe that your call will be tracked, we do not have any control over how the remote server uses your data. So please proceed with care and consider checking the Unpaywall privacy policy.
Archived links via Wayback Machine
For web page which are no longer available, try to retrieve content from the of the Internet Archive (if available).
Privacy notice: By enabling the option above, your browser will contact the API of archive.org to check for archived content of web pages that are no longer available. Although we do not have any reason to believe that your call will be tracked, we do not have any control over how the remote server uses your data. So please proceed with care and consider checking the Internet Archive privacy policy.
Reference lists
Add a list of references from ,
, and
to record detail pages.
load references from crossref.org and opencitations.net
Privacy notice: By enabling the option above, your browser will contact the APIs of crossref.org, opencitations.net, and semanticscholar.org to load article reference information. Although we do not have any reason to believe that your call will be tracked, we do not have any control over how the remote server uses your data. So please proceed with care and consider checking the Crossref privacy policy and the OpenCitations privacy policy, as well as the AI2 Privacy Policy covering Semantic Scholar.
Citation data
Add a list of citing articles from and
to record detail pages.
load citations from opencitations.net
Privacy notice: By enabling the option above, your browser will contact the API of opencitations.net and semanticscholar.org to load citation information. Although we do not have any reason to believe that your call will be tracked, we do not have any control over how the remote server uses your data. So please proceed with care and consider checking the OpenCitations privacy policy as well as the AI2 Privacy Policy covering Semantic Scholar.
OpenAlex data
Load additional information about publications from .
Privacy notice: By enabling the option above, your browser will contact the API of openalex.org to load additional information. Although we do not have any reason to believe that your call will be tracked, we do not have any control over how the remote server uses your data. So please proceed with care and consider checking the information given by OpenAlex.
last updated on 2024-08-05 21:20 CEST by the dblp team
all metadata released as open data under CC0 1.0 license
see also: Terms of Use | Privacy Policy | Imprint
dblp was originally created in 1993 at:
since 2018, dblp has been operated and maintained by:
the dblp computer science bibliography is funded and supported by: