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Hans A. R. Manhaeve
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2020 – today
- 2020
- [c16]Ghazanfar Ali, Leila Bagheriye, Hans A. R. Manhaeve, Hans G. Kerkhoff:
On-chip EOL Prognostics Using Data-Fusion of Embedded Instruments for Dependable MP-SoCs. ATS 2020: 1-6
2010 – 2019
- 2015
- [j4]Marco Ottavi, Salvatore Pontarelli, Dimitris Gizopoulos, Cristiana Bolchini, Maria K. Michael, Lorena Anghel, Mehdi Baradaran Tahoori, Antonis M. Paschalis, Pedro Reviriego, Oliver Bringmann, Viacheslav Izosimov, Hans A. R. Manhaeve, Christos Strydis, Said Hamdioui:
Dependable Multicore Architectures at Nanoscale: The View From Europe. IEEE Des. Test 32(2): 17-28 (2015) - 2013
- [j3]Dimitris Gizopoulos, Said Hamdioui, Hans A. R. Manhaeve:
Guest Editorial - Special Issue on Manufacturable and Dependable Multicore Architectures at Nanoscale (MEDIAN). J. Electron. Test. 29(2): 125-126 (2013) - [c15]Hans A. R. Manhaeve, Pete Harrod, Adit D. Singh, Chintan Patel, Ralf Arnolc, Davide Appello:
Current testing: Dead or alive? ETS 2013: 1 - [c14]Hans A. R. Manhaeve, Esko Mikkola:
Semiconductor failure modes and mitigation for critical systems embedded tutorial. ETS 2013: 1-3
2000 – 2009
- 2008
- [c13]B. Straka, Hans A. R. Manhaeve, J. Brenkus, Stefaan Kerckenaere:
Theoretical and Practical Aspects of IDDQ Settling-Impact on Measurement Timing and Quality. DATE 2008: 1310-1315 - [c12]Hans A. R. Manhaeve:
The Quest for Test: Will Redundancy Cover All? DDECS 2008: 3 - 2005
- [c11]Hans A. R. Manhaeve:
Current Testing for Nanotechnologies: A Demystifying Application Perspective.. Asian Test Symposium 2005: 456 - 2004
- [j2]Hans A. R. Manhaeve:
Current testing for nanotechnologies: Myths, facts, and figures. IEEE Des. Test Comput. 21(3): 264- (2004) - 2003
- [c10]Alessandra Fudoli, Alberto Ascagni, Davide Appello, Hans A. R. Manhaeve:
A practical evaluation of IDDQ test strategies for deep submicron production test application. Experiences and targets from the field. ETW 2003: 65-70 - 2002
- [c9]Hans A. R. Manhaeve, Joseph S. Vaccaro, Loren Benecke, David Prystasz:
A real world application used to implement a true IDDQ based test strategy (facts and figures). ETW 2002: 81-86 - 2001
- [c8]Hans A. R. Manhaeve, Stefaan Kerckenaere:
An On-Chip Detection Circuit for the Verification of IC Supply Connections. DFT 2001: 57-65 - 2000
- [j1]Hans A. R. Manhaeve, Johan Verfaillie, B. Straka, J. P. Cornil:
Application of Supply Current Testing to Analogue Circuits, Towards a Structural Analogue Test Methodology. J. Electron. Test. 16(3): 227-234 (2000)
1990 – 1999
- 1999
- [c7]Viera Stopjaková, Hans A. R. Manhaeve, M. Sidiropulos:
On-Chip Transient Current Monitor for Testing of Low Voltage CMOS IC. DATE 1999: 538-542 - [c6]Hans A. R. Manhaeve, Johan Verfaillie, B. Straka, J. P. Cornil:
Application of supply current testing to analogue circuits, towards a structural analogue test methodology. ETW 1999: 51-56 - 1998
- [c5]B. Straka, Hans A. R. Manhaeve, Jozef Vanneuville, M. Svajda:
A Fully Digital Controlled Off-Chip IDDQ Measurement Unit. DATE 1998: 495-500 - [c4]M. Svajda, B. Straka, Hans A. R. Manhaeve:
IOCIMU - An Integrated Off-Chip IDDQ Measurement Unit. DATE 1998: 959-960 - 1997
- [c3]Viera Stopjaková, Hans A. R. Manhaeve:
CCII+ current conveyor based BIC monitor for IDDQ testing of complex CMOS circuits. ED&TC 1997: 266-270 - [c2]M. Svajda, B. Straka, Hans A. R. Manhaeve:
A monolithic off-chip IDDQ monitor. ED&TC 1997: 629 - 1994
- [c1]Hans A. R. Manhaeve, Paul L. Wrighton, Jos van Sas, Urbain Swerts:
An Off-chip IDDQ Current Measurement Unit for Telecommunication ASICs. ITC 1994: 203-212
Coauthor Index
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