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Piet W. Verbeek
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2010 – 2019
- 2011
- [c23]Bernd Rieger, Lucas J. van Vliet
, Piet W. Verbeek:
Continuous Orientation Representation for Arbitrary Dimensions - A Generalized Knutsson Mapping. SCIA 2011: 774-783
2000 – 2009
- 2006
- [c22]Judith Dijk, Piet W. Verbeek:
Lightness filtering in color images with respect to the gamut. CGIV 2006: 330-335 - 2005
- [j15]Cris L. Luengo Hendriks
The generalized Radon transform: Sampling, accuracy and memory considerations. Pattern Recognit. 38(12): 2494-2505 (2005) - 2004
- [j14]Bernd Rieger, Frederik J. Timmermans, Lucas J. van Vliet
On Curvature Estimation of ISO Surfaces in 3D Gray-Value Images and the Computation of Shape Descriptors. IEEE Trans. Pattern Anal. Mach. Intell. 26(8): 1088-1094 (2004) - [c21]Lucas J. van Vliet, Piet W. Verbeek, Ian T. Young:
Quantitative Imaging: How to Measure Size Features in Digitized Images. ISBI 2004: 1227-1230 - 2003
- [c20]Judith Dijk, Michael van Ginkel, Rutger J. van Asselt, Lucas J. van Vliet, Piet W. Verbeek:
A New Sharpness Measure Based on Gaussian Lines and Edges. CAIP 2003: 149-156 - [c19]Cris L. Luengo Hendriks, Michael van Ginkel, Piet W. Verbeek, Lucas J. van Vliet:
The Generalised Radon Transform: Sampling and Memory Considerations. CAIP 2003: 681-688 - [c18]Piet W. Verbeek, Judith Dijk:
The D-Dimensional Inverse Vector-Gradient Operator and Its Application for Scale-Free Image Enhancement. CAIP 2003: 738-745 - [c17]Michael van Ginkel, M. A. Kraaijveld, Lucas J. van Vliet, E. P. Reding, Piet W. Verbeek, H. J. Lammers:
Robust Curve Detection Using a Radon Transform in Orientation Space. SCIA 2003: 125-132 - [c16]Bernd Rieger, Lucas J. van Vliet, Piet W. Verbeek:
Estimation of Curvature Based Shape Properties of Surfaces in 3D Grey-Value Images. SCIA 2003: 262-267 - 2002
- [c15]Judith Dijk, Piet W. Verbeek, Jan Walraven, Ian T. Young:
The Effect of Gamma and Chroma on the Perception of Color Images. CGIV 2002: 175-180 - [c14]Bernd Rieger, Frederik J. Timmermans, Lucas J. van Vliet, Piet W. Verbeek:
Curvature Estimation of Surfaces in 3D Grey-Value Images. ICPR (1) 2002: 684-687 - 2001
- [j13]Joost van de Weijer
Curvature Estimation in Oriented Patterns Using Curvilinear Models Applied to Gradient Vector Fields. IEEE Trans. Pattern Anal. Mach. Intell. 23(9): 1035-1042 (2001) - [c13]Peter Bakker, Lucas J. van Vliet, Piet W. Verbeek:
Confidence and Curvature Estimation of Curvilinear Structures in 3-D. ICCV 2001: 139-144 - 2000
- [c12]René G. de Vries, Piet W. Verbeek:
Scale-Adaptive Landmark Detection, Classification and Size Estimation in 3D Object-Background Images. ICPR 2000: 7026-7029
1990 – 1999
- 1999
- [j12]Dick de Ridder, Robert P. W. Duin, Piet W. Verbeek:
The Applicability of Neural Networks to Non-linear Image Processing. Pattern Anal. Appl. 2(2): 111-128 (1999) - [c11]Peter Bakker, Lucas J. van Vliet, Piet W. Verbeek:
Edge Preserving Orientation Adaptive Filtering. CVPR 1999: 1535-1540 - 1998
- [c10]Dick de Ridder, Robert P. W. Duin, Piet W. Verbeek, Lucas J. van Vliet:
On the Application of Neural Networks to Non-Linear Image Processing Tasks. ICONIP 1998: 161-165 - [c9]Lucas J. van Vliet, Ian T. Young, Piet W. Verbeek:
Recursive Gaussian derivative filters. ICPR 1998: 509-514 - [c8]Piet W. Verbeek, Lucas J. van Vliet, Joost van de Weijer
Improved curvature and anisotropy estimation for curved line bundles. ICPR 1998: 528-533 - 1997
- [c7]Michiel de Bakker, Piet W. Verbeek, Gijs K. Steenvoorden:
Design Considerations for a Range Image Sensor Containing a PSD-array and An On-chip Multiplexer. 3DIM 1997: 11-18 - 1996
- [j11]Marnix K. N. Schöyer, Piet W. Verbeek:
Block position dithering in DCT-coded sequences. Signal Process. Image Commun. 8(6): 545-549 (1996) - [c6]Maarten P. P. Schlicher, Erik Bouts, Piet W. Verbeek:
Fast analytical medial-axis localization in convex polyhedra. ICPR 1996: 55-61 - [c5]Michiel de Bakker, Piet W. Verbeek, Frank van den Ouden, Gijs K. Steenvoorden:
High-speed acquisition of range images. ICPR 1996: 293-297 - 1994
- [j10]Piet W. Verbeek, Lucas J. van Vliet
On the Location Error of Curved Edges in Low-Pass Filtered 2-D and 3-D Images. IEEE Trans. Pattern Anal. Mach. Intell. 16(7): 726-733 (1994) - [j9]Lucas J. van Vliet
Edge localization by MoG filters: Multiple-of-Gaussians. Pattern Recognit. Lett. 15(5): 485-496 (1994) - 1993
- [j8]Ben J. H. Verwer, Lucas J. van Vliet, Piet W. Verbeek:
Binary and Grey-Value Skeletons: Metrics and Algorithms. Int. J. Pattern Recognit. Artif. Intell. 7(5): 1287-1308 (1993) - 1992
- [c4]Piet W. Verbeek, Lucas J. van Vliet:
An estimator of edge length and surface area in digitized 2D and 3D images. ICPR (3) 1992: 1-5 - [c3]Piet W. Verbeek, Lucas J. van Vliet:
Line and edge detection by symmetry filters. ICPR (3) 1992: 749-753 - 1990
- [j7]Piet W. Verbeek, Ben J. H. Verwer:
Shading from shape, the eikonal equation solved by grey-weighted distance transform. Pattern Recognit. Lett. 11(10): 681-690 (1990)
1980 – 1989
- 1989
- [j6]Ben J. H. Verwer, Piet W. Verbeek, Simon T. Dekker:
An Efficient Uniform Cost Algorithm Applied to Distance Transforms. IEEE Trans. Pattern Anal. Mach. Intell. 11(4): 425-429 (1989) - [j5]Piet W. Verbeek, Ben J. H. Verwer:
2-D adaptive smoothing by 3-D distance transformation. Pattern Recognit. Lett. 9(1): 53-65 (1989) - 1986
- [c2]Piet W. Verbeek, Leo Dorst, Ben J. H. Verwer, Frans C. A. Groen:
Collision Avoidance and Path Finding through Constrained Distance Tranceformation in Robot State Space. IAS 1986: 627-634 - 1985
- [j4]Piet W. Verbeek:
A class of sampling-error free measures in oversampled band-limited images. Pattern Recognit. Lett. 3(4): 287-292 (1985) - 1984
- [j3]Frans A. Gerritsen, Piet W. Verbeek:
Implementation of cellular-logic operators using 3*3 convolution and table lookup hardware. Comput. Vis. Graph. Image Process. 27(1): 115-123 (1984) - 1981
- [j2]Frans C. A. Groen, Piet W. Verbeek, N. de Jong, J. W. Klumper:
The smallest box around a package. Pattern Recognit. 14(1-6): 173-178 (1981) - 1980
- [j1]Steven Lobregt, Piet W. Verbeek, Frans C. A. Groen:
Three-Dimensional Skeletonization: Principle and Algorithm. IEEE Trans. Pattern Anal. Mach. Intell. 2(1): 75-77 (1980)
1970 – 1979
- 1977
- [c1]Frans C. A. Groen, Piet W. Verbeek, M. van der Ploeg:
Computation of DNA-based parameters from chromosome scans. Digital Image Processing 1977: 21-30
Coauthor Index
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