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Takaharu Nagumo

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2000 – 2009

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2002
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Kazumi Hatayama, Michinobu Nakao, Yoshikazu Kiyoshige, Koichiro Natsume, Yasuo Sato, Takaharu Nagumo:
Application of High-Quality Built-In Test to Industrial Designs. ITC 2002: 1003-1012
2001
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Michinobu Nakao, Yoshikazu Kiyoshige, Kazumi Hatayama, Yasuo Sato, Takaharu Nagumo:
Test Generation for Multiple-Threshold Gate-Delay Fault Model. Asian Test Symposium 2001: 244-
2000
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  - conf/itc/SatoINN00
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Yasuo Sato, Toyohito Ikeya, Michinobu Nakao, Takaharu Nagumo:
A BIST approach for very deep sub-micron (VDSM) defects. ITC 2000: 283-291

1990 – 1999

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1994
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Takaharu Nagumo, Masahiko Nagai, Takao Nishida, Masayuki Miyoshi, Shunsuke Miyamoto:
VFSIM: Vectorized Fault Simulator Using a Reduction Technique Excluding Temporarily Unobservable Faults. DAC 1994: 510-515

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