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Tae-Kyun Kim 0003

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affiliation: Yonsei University, Department of Electrical and Electronic Engineering, Seoul, South Korea

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2023
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Tae-Kyun Kim, Jong-Gwan Yook, Joo Yong Kim, Yong Ho Cho:
Signal Integrity Analysis of RF Probe Card for WLCSP Testing Using Polyimide-Based Grounded Coplanar Waveguide Transmission Lines. IEEE Access 11: 79929-79940 (2023)
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Tae-Kyun Kim, Jong-Gwan Yook, Joo-Yong Kim, Yong-Ho Cho, Uh-Hyeon Lee:
Fabrication and Characterization of Three-Dimensional Microelectromechanical System Coaxial Socket Device for Semiconductor Package Testing. Sensors 23(14): 6350 (2023)

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