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Md Toufiq Hasan Anik
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2020 – today
- 2024
- [j4]Md Toufiq Hasan Anik
, Jean-Luc Danger
On the Resiliency of Protected Masked S-Boxes Against Template Attack in the Presence of Temperature and Aging Misalignments. IEEE Trans. Very Large Scale Integr. Syst. 32(5): 911-924 (2024) - [c8]Md Toufiq Hasan Anik, Hasin Ishraq Reefat, Jean-Luc Danger, Sylvain Guilley, Naghmeh Karimi:
Attacking Multi-Tenant FPGAs Without Manual Placement and Routing. ISVLSI 2024: 367-372 - 2023
- [c7]Md Toufiq Hasan Anik
Aging-Induced Failure Prognosis via Digital Sensors. ACM Great Lakes Symposium on VLSI 2023: 703-708 - 2021
- [j3]Bijan Fadaeinia
Masked SABL: A Long Lasting Side-Channel Protection Design Methodology. IEEE Access 9: 90455-90464 (2021) - [j2]Md Toufiq Hasan Anik
Reducing Aging Impacts in Digital Sensors via Run-Time Calibration. J. Electron. Test. 37(5): 653-673 (2021) - [j1]Md Toufiq Hasan Anik, Jean-Luc Danger, Sylvain Guilley
Detecting Failures and Attacks via Digital Sensors. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 40(7): 1315-1326 (2021) - [c6]Md Toufiq Hasan Anik, Bijan Fadaeinia, Amir Moradi
On the Impact of Aging on Power Analysis Attacks Targeting Power-Equalized Cryptographic Circuits. ASP-DAC 2021: 414-420 - [c5]Md Toufiq Hasan Anik, Jean-Luc Danger, Omar Diankha, Mohammad Ebrahimabadi, Christoph Frisch, Sylvain Guilley, Naghmeh Karimi, Michael Pehl, Sofiane Takarabt:
Testing and Reliability Enhancement of Security Primitives. DFT 2021: 1-8 - [c4]Ke Huang, Md Toufiq Hasan Anik, Xinqiao Zhang
Real-Time IC Aging Prediction via On-Chip Sensors. ISVLSI 2021: 13-18 - 2020
- [c3]Md Toufiq Hasan Anik, Rachit Saini, Jean-Luc Danger, Sylvain Guilley, Naghmeh Karimi:
Failure and Attack Detection by Digital Sensors. ETS 2020: 1-2 - [c2]Md Toufiq Hasan Anik, Mohammad Ebrahimabadi, Hamed Pirsiavash, Jean-Luc Danger, Sylvain Guilley, Naghmeh Karimi:
On-Chip Voltage and Temperature Digital Sensor for Security, Reliability, and Portability. ICCD 2020: 506-509 - [c1]Md Toufiq Hasan Anik, Sylvain Guilley, Jean-Luc Danger, Naghmeh Karimi:
On the Effect of Aging on Digital Sensors. VLSID 2020: 189-194
Coauthor Index
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last updated on 2024-10-07 22:21 CEST by the dblp team
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