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Iftekhar Ibne Basith
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2020 – today
- 2024
- [i1]Syed Hasib Akhter Faruqui, Nazia Tasnim, Iftekhar Ibne Basith, Suleiman Obeidat
, Faruk Yildiz:
Integrating A.I. in Higher Education: Protocol for a Pilot Study with 'SAMCares: An Adaptive Learning Hub'. CoRR abs/2405.00330 (2024) - 2023
- [c8]Iftekhar Ibne Basith, Syed Hasib Akhter Faruqui, Vajih Khan, Suleiman Obeidat
WIP: STEM Course Enhancement - Animated Safety Modules for Freshman Circuit Class. FIE 2023: 1-3
2010 – 2019
- 2017
- [j4]Iftekhar Ibne Basith, Esrafil Jedari, Rashid Rashidzadeh:
A contactless probe utilizing inductive coupling. Microelectron. J. 63: 1-7 (2017) - 2016
- [j3]Iftekhar Ibne Basith, Rashid Rashidzadeh:
Contactless Test Access Mechanism for TSV-Based 3-D ICs Utilizing Capacitive Coupling. IEEE Trans. Instrum. Meas. 65(1): 88-95 (2016) - [c7]Iftekhar Ibne Basith, Tareq Muhammad Supon, Esam Abdel-Raheem, Rashid Rashidzadeh:
Comparative study on bus-coding schemes and improvement on SINV coding. ICM 2016: 17-20 - 2015
- [c6]Mohammed Alamgir, Iftekhar Ibne Basith, Tareq Muhammad Supon, Rashid Rashidzadeh:
Improved bus-shift coding for low-power I/O. ISCAS 2015: 2940-2943 - [c5]Iftekhar Ibne Basith, Rashid Rashidzadeh, Esam Abdel-Raheem:
Contactless detection of faulty TSV in 3D IC via capacitive coupling. MWSCAS 2015: 1-4 - 2014
- [j2]Nabeeh Kandalaft, Iftekhar Ibne Basith, Rashid Rashidzadeh:
Low-Contact Resistance Probe Card Using MEMS Technology. IEEE Trans. Instrum. Meas. 63(12): 2882-2889 (2014) - [c4]Rashid Rashidzadeh, Iftekhar Ibne Basith:
A test probe for TSV using resonant inductive coupling. ITC 2014: 1-10 - 2013
- [j1]Iftekhar Ibne Basith, Nabeeh Kandalaft, Rashid Rashidzadeh, Majid Ahmadi:
Charge-Controlled Readout and BIST Circuit for MEMS Sensors. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 32(3): 433-441 (2013) - 2011
- [c3]Iftekhar Ibne Basith, Tareq Muhammad Supon, Ajit Muhury, Rashid Rashidzadeh, Majid Ahmadi:
Performance enhancement of single electron junction 1-bit full adder. ICECS 2011: 157-160 - 2010
- [c2]Iftekhar Ibne Basith, Nabeeh Kandalaft, Rashid Rashidzadeh:
Built-In Self-Test for Capacitive MEMS Using a Charge Control Technique. Asian Test Symposium 2010: 135-140 - [c1]Nabeeh Kandalaft, Iftekhar Ibne Basith, Rashid Rashidzadeh:
A MEMS based device interface board. ITC 2010: 804
Coauthor Index
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