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Amy Germida
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2000 – 2009
- 2000
- [c4]James F. Plusquellic, Amy Germida, Jonathan Hudson, Ernesto Staroswiecki, Chintan Patel:
Predicting device performance from pass/fail transient signal analysis data. ITC 2000: 1070-1079 - [c3]Amy Germida, James F. Plusquellic:
Detection of CMOS Defects under Variable Processing Conditions. VTS 2000: 195-204
1990 – 1999
- 1999
- [c2]James F. Plusquellic, Amy Germida, Zheng Yan:
8-Bit Multiplier Simulation Experiments Investigating the Use of Power Supply Transient Signals for the Detection of CMOS Defects. DFT 1999: 68-76 - [c1]Amy Germida, Zheng Yan, James F. Plusquellic, Fidel Muradali:
Defect detection using power supply transient signal analysis. ITC 1999: 67-76
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