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Tien-Duy B. Le
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2020 – today
- 2023
- [c20]Vinay Kabadi, Dezhen Kong, Siyu Xie, Lingfeng Bao, Gede Artha Azriadi Prana, Tien-Duy B. Le, Xuan-Bach Dinh Le, David Lo:
The Future Can't Help Fix The Past: Assessing Program Repair In The Wild. ICSME 2023: 50-61
2010 – 2019
- 2019
- [j6]Thong Hoang, Richard Jayadi Oentaryo, Tien-Duy B. Le, David Lo:
Network-Clustered Multi-Modal Bug Localization. IEEE Trans. Software Eng. 45(10): 1002-1023 (2019) - 2018
- [j5]Zherui Cao, Yuan Tian, Tien-Duy B. Le, David Lo:
Rule-based specification mining leveraging learning to rank. Autom. Softw. Eng. 25(3): 501-530 (2018) - [j4]Yun Zhang, David Lo, Xin Xia, Giuseppe Scanniello, Tien-Duy B. Le, Jianling Sun:
Fusing multi-abstraction vector space models for concern localization. Empir. Softw. Eng. 23(4): 2279-2322 (2018) - [c19]Tien-Duy B. Le, Lingfeng Bao, David Lo, Debin Gao, Li Li:
Towards Mining Comprehensive Android Sandboxes. ICECCS 2018: 51-60 - [c18]Tien-Duy B. Le, David Lo:
Deep specification mining. ISSTA 2018: 106-117 - [c17]Tien-Duy B. Le, Lingfeng Bao, David Lo:
DSM: a specification mining tool using recurrent neural network based language model. ESEC/SIGSOFT FSE 2018: 896-899 - [c16]Lingfeng Bao, Tien-Duy B. Le, David Lo:
Mining sandboxes: Are we there yet? SANER 2018: 445-455 - [i1]Thong Hoang, Richard Jayadi Oentaryo, Tien-Duy B. Le, David Lo:
Network-Clustered Multi-Modal Bug Localization. CoRR abs/1802.09729 (2018) - 2017
- [j3]Tien-Duy B. Le, Ferdian Thung, David Lo:
Will this localization tool be effective for this bug? Mitigating the impact of unreliability of information retrieval based bug localization tools. Empir. Softw. Eng. 22(4): 2237-2279 (2017) - 2016
- [j2]Xin Xia, Liang Gong, Tien-Duy B. Le, David Lo, Lingxiao Jiang, Hongyu Zhang:
Diversity maximization speedup for localizing faults in single-fault and multi-fault programs. Autom. Softw. Eng. 23(1): 43-75 (2016) - [c15]Yun Zhang, David Lo, Xin Xia, Tien-Duy B. Le, Giuseppe Scanniello, Jianling Sun:
Inferring Links between Concerns and Methods with Multi-abstraction Vector Space Model. ICSME 2016: 110-121 - [c14]Tien-Duy B. Le, David Lo, Claire Le Goues, Lars Grunske:
A learning-to-rank based fault localization approach using likely invariants. ISSTA 2016: 177-188 - 2015
- [j1]Tien-Duy B. Le, David Lo, Ferdian Thung:
Should I follow this fault localization tool's output? - Automated prediction of fault localization effectiveness. Empir. Softw. Eng. 20(5): 1237-1274 (2015) - [c13]Tien-Duy B. Le, David Lo, Ming Li:
Constrained feature selection for localizing faults. ICSME 2015: 501-505 - [c12]Xuan-Bach Dinh Le, Tien-Duy B. Le, David Lo:
Should fixing these failures be delegated to automated program repair? ISSRE 2015: 427-437 - [c11]Tien-Duy B. Le, Mario Linares Vásquez, David Lo, Denys Poshyvanyk:
RCLinker: automated linking of issue reports and commits leveraging rich contextual information. ICPC 2015: 36-47 - [c10]Tien-Duy B. Le, Xuan-Bach Dinh Le, David Lo, Ivan Beschastnikh:
Synergizing Specification Miners through Model Fissions and Fusions (T). ASE 2015: 115-125 - [c9]Tien-Duy B. Le, Richard Jayadi Oentaryo, David Lo:
Information retrieval and spectrum based bug localization: better together. ESEC/SIGSOFT FSE 2015: 579-590 - [c8]Tien-Duy B. Le, David Lo:
Beyond support and confidence: Exploring interestingness measures for rule-based specification mining. SANER 2015: 331-340 - 2014
- [c7]Tien-Duy B. Le, Jooyong Yi, David Lo, Ferdian Thung, Abhik Roychoudhury:
Dynamic Inference of Change Contracts. ICSME 2014: 451-455 - [c6]Tien-Duy B. Le, Ferdian Thung, David Lo:
Predicting Effectiveness of IR-Based Bug Localization Techniques. ISSRE 2014: 335-345 - [c5]Pavneet Singh Kochhar, Tien-Duy B. Le, David Lo:
It's not a bug, it's a feature: does misclassification affect bug localization? MSR 2014: 296-299 - [c4]Ferdian Thung, Tien-Duy B. Le, Pavneet Singh Kochhar, David Lo:
BugLocalizer: integrated tool support for bug localization. SIGSOFT FSE 2014: 767-770 - 2013
- [c3]Tien-Duy B. Le, David Lo:
Will Fault Localization Work for These Failures? An Automated Approach to Predict Effectiveness of Fault Localization Tools. ICSM 2013: 310-319 - [c2]Tien-Duy B. Le, Shaowei Wang, David Lo:
Multi-abstraction Concern Localization. ICSM 2013: 364-367 - [c1]Tien-Duy B. Le, Ferdian Thung, David Lo:
Theory and Practice, Do They Match? A Case with Spectrum-Based Fault Localization. ICSM 2013: 380-383
Coauthor Index
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