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Meng Zhang 0014
Person information
- affiliation: Huazhong University of Science and Technology, Wuhan National Laboratory for Optoelectronics, China
Other persons with the same name
- Meng Zhang — disambiguation page
- Meng Zhang 0001 — Tsinghua University, Department of Computer Science and Technology, Beijing, China
- Meng Zhang 0002
— Shanghai Jiao Tong University, Department of Electronic Engineering, China
- Meng Zhang 0003
- Meng Zhang 0004
- Meng Zhang 0005
- Meng Zhang 0006
- Meng Zhang 0007 — University of Florida, Department of Agricultural and Biological Engineering, Gainesville, FL, USA
- Meng Zhang 0008
- Meng Zhang 0009 — China Telecom, Department of Technology Innovation Center, Beijing, China (and 1 more)
- Meng Zhang 0010
- Meng Zhang 0011
- Meng Zhang 0012
- Meng Zhang 0013
- Meng Zhang 0015
- Meng Zhang 0016
- Meng Zhang 0017 — Duke University, Durham, NC, USA
- Meng Zhang 0018
- Meng Zhang 0019 — Huawei Noah's Ark Lab (and 2 more)
- Meng Zhang 0020 — Chinese Academy of Sciences, Institute of Information Engineering, Beijing, China
- Meng Zhang 0021 — University of Cambridge, UK
- Meng Zhang 0022
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2020 – today
- 2023
- [j16]Meng Zhang
eLDPC: An Efficient LDPC Coding Scheme for Phase-Change Memory. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 42(6): 1978-1987 (2023) - [j15]Xiaotong Fang
High-Precision Short-Term Lifetime Prediction in TLC 3-D NAND Flash Memory as Hot-Data Storage. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 42(10): 3224-3235 (2023) - [j14]Yingge Li, Guojun Han
Exploiting the Single-Symbol LLR Variation to Accelerate LDPC Decoding for 3-D nand Flash Memory. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 42(12): 5146-5150 (2023) - [j13]Yingge Li, Guojun Han
Exploiting Metadata to Estimate Read Reference Voltage for 3-D nand Flash Memory. IEEE Trans. Consumer Electron. 69(1): 9-17 (2023) - [j12]Meng Zhang
ALCod: Adaptive LDPC Coding for 3-D NAND Flash Memory Using Inter-Layer RBER Variation. IEEE Trans. Consumer Electron. 69(4): 1068-1081 (2023) - 2022
- [j11]Menghua Jia, Yachen Kong
Optimal Program-Read Schemes Toward Highly Reliable Open Block Operations in 3-D Charge-Trap NAND Flash Memory. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 41(11): 4797-4807 (2022) - [j10]Lanlan Cui, Fei Wu, Xiaojian Liu, Meng Zhang, Renzhi Xiao, Changsheng Xie:
Improving LDPC Decoding Performance for 3D TLC NAND Flash by LLR Optimization Scheme for Hard and Soft Decision. ACM Trans. Design Autom. Electr. Syst. 27(1): 5:1-5:20 (2022) - [j9]Weihua Liu
Characterization Summary of Performance, Reliability, and Threshold Voltage Distribution of 3D Charge-Trap NAND Flash Memory. ACM Trans. Storage 18(2): 16:1-16:25 (2022) - [c13]Xiaotong Fang, Meng Zhang, Yifan Guo, Fei Chen, Binglu Chen, Xuepeng Zhan, Jixuan Wu, Fei Wu, Jiezhi Chen:
Work-in-Progress: High-Precision Short-Term Lifetime Prediction in TLC 3D NAND Flash Memory as Hot-data Storage. CASES 2022: 11-12 - 2021
- [j8]Ruixiang Ma
Write-Optimized B+ Tree Index Technology for Persistent Memory. J. Comput. Sci. Technol. 36(5): 1037-1050 (2021) - [j7]Weihua Liu
DEPS: Exploiting a Dynamic Error Prechecking Scheme to Improve the Read Performance of SSD. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 40(1): 66-77 (2021) - [c12]Weihua Liu, Fei Wu, Jian Zhou, Meng Zhang, Chengmo Yang, Zhonghai Lu, Yu Wang, Changsheng Xie:
Modeling of Threshold Voltage Distribution in 3D NAND Flash Memory. DATE 2021: 1729-1732 - 2020
- [j6]Fei Wu, Meng Zhang
Using Error Modes Aware LDPC to Improve Decoding Performance of 3-D TLC NAND Flash. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 39(4): 909-921 (2020) - [j5]Yachen Kong
Retention Correlated Read Disturb Errors in 3-D Charge Trap NAND Flash Memory: Observations, Analysis, and Solutions. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 39(11): 4042-4051 (2020) - [c11]Meng Zhang, Fei Wu, Qin Yu, Weihua Liu, Lanlan Cui, Yahui Zhao, Changsheng Xie:
BeLDPC: Bit Errors Aware Adaptive Rate LDPC Codes for 3D TLC NAND Flash Memory. DATE 2020: 302-305
2010 – 2019
- 2019
- [j4]Ruixiang Ma
RBER-Aware Lifetime Prediction Scheme for 3D-TLC NAND Flash Memory. IEEE Access 7: 44696-44708 (2019) - [j3]Meng Zhang
Pair-Bit Errors Aware LDPC Decoding in MLC NAND Flash Memory. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 38(12): 2312-2320 (2019) - [c10]Yajuan Du, Yao Zhou, Meng Zhang, Wei Liu, Shengwu Xiong
Adapting Layer RBERs Variations of 3D Flash Memories via Multi-granularity Progressive LDPC Reading. DAC 2019: 37 - [c9]Weihua Liu, Fei Wu, Meng Zhang, Yifei Wang, Zhonghai Lu, Xiangfeng Lu, Changsheng Xie:
Characterizing the Reliability and Threshold Voltage Shifting of 3D Charge Trap NAND Flash. DATE 2019: 312-315 - [c8]Lanlan Cui, Fei Wu, Xiaojian Liu, Meng Zhang, Changsheng Xie:
VaLLR: Threshold Voltage Distribution Aware LLR Optimization to Improve LDPC Decoding Performance for 3D TLC NAND Flash. ICCD 2019: 668-671 - [c7]Yajuan Du, Wei Liu, Yu Zhu, Meng Zhang:
United SSD block cleaning via constrained victim block selection. SAC 2019: 250-257 - 2018
- [j2]Meng Zhang
RBER Aware Multi-Sensing for Improving Read Performance of 3D MLC NAND Flash Memory. IEEE Access 6: 61934-61947 (2018) - 2017
- [j1]Fei Wu, Meng Zhang, Yajuan Du, Xubin He, Ping Huang, Changsheng Xie, Jiguang Wan:
A Program Interference Error Aware LDPC Scheme for Improving NAND Flash Decoding Performance. ACM Trans. Embed. Comput. Syst. 16(5s): 141:1-141:20 (2017) - [c6]Meng Zhang, Fei Wu, He Huang, Qian Xia, Jian Zhou, Changsheng Xie:
FPGA-based failure mode testing and analysis for MLC NAND flash memory. DATE 2017: 434-439 - [c5]Shunzhuo Wang, Fei Wu, Zhonghai Lu, You Zhou, Qin Xiong, Meng Zhang, Changsheng Xie:
Lifetime adaptive ECC in NAND flash page management. DATE 2017: 1253-1556 - [c4]Meng Zhang, Fei Wu, Yajuan Du, Chengmo Yang, Changsheng Xie, Jiguang Wan:
CooECC: A Cooperative Error Correction Scheme to Reduce LDPC Decoding Latency in NAND Flash. ICCD 2017: 657-664 - [c3]Yajuan Du, Yunpei Jia, Meng Zhang, Jun Zeng, Chun Jason Xue:
Enhancing SSD performance with LDPC-aware garbage collection. NVMSA 2017: 1-4 - 2016
- [c2]Meng Zhang, Fei Wu, Xubin He, Ping Huang, Shunzhuo Wang, Changsheng Xie:
REAL: A retention error aware LDPC decoding scheme to improve NAND flash read performance. MSST 2016: 1-13 - 2015
- [c1]Meng Zhang, Fei Wu, Changsheng Xie, You Zhou, Kai Zou:
A novel optimization algorithm for Chien search of BCH Codes in NAND flash memory devices. NAS 2015: 106-111
Coauthor Index
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