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Sang Jin Byeon

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2010 – 2019

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2015
[j1]
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  - journals/jssc/LeeKKLBKCLC15
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  persistent URL:
  - https://dblp.org/rec/journals/jssc/LeeKKLBKCLC15
Dong-Uk Lee, Kyung Whan Kim, Kwan-Weon Kim, Kang Seol Lee, Sang Jin Byeon, Jae-Hwan Kim, Jin-Hee Cho, Jaejin Lee, Jun Hyun Chun:
A 1.2 V 8 Gb 8-Channel 128 GB/s High-Bandwidth Memory (HBM) Stacked DRAM With Effective I/O Test Circuits. IEEE J. Solid State Circuits 50(1): 191-203 (2015)
2014
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  - conf/vlsic/LeeKKLBCJNLCH14
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Dong-Uk Lee, Kyung Whan Kim, Kwan-Weon Kim, Kang Seol Lee, Sang Jin Byeon, Jin-Hee Cho, Han Ho Jin, Sang Kyun Nam, Jaejin Lee, Jun Hyun Chun, Sung-Joo Hong:
An exact measurement and repair circuit of TSV connections for 128GB/s high-bandwidth memory(HBM) stacked DRAM. VLSIC 2014: 1-2

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